F00700 - SEMI F7 - フロロカーボン製チューブフィッティング接合部の引張り強さを測定するテスト方法 StdPbc-1011 and GaP with {100} or

and GaP with {100} or {111} surfaces by structural etching

and distribution of hydrogen peroxide within the semiconductor or flat panel display facility

SEMI PV66-0715 (first published)

and materials use efficiency

F00700 - SEMI F7 - フロロカーボン製チューブフィッティング接合部の引張り強さを測定するテスト方法 StdPbc-1011 and GaP with {100} orFacilities CommitteeNorth American Facilities Committee199810North American Regional Standards Committee19992SEMI On Line199921992 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. SIU. S. Referenced SEMI Standards None.